The use of brain scans to detect Alzheimer’s disease was the topic of a lecture by Dr. John Csernansky, director of the Silvio O. Conte Center for Neuroscience Research at Washington University, St. Louis, at Vanderbilt University March 9. The lecture was part of the Brainstorm 2006 lecture and event series.
Contact: Terri Ray, (615) 322-3532
terri.ray@vanderbilt.edu