Skip to Content

Research News at Vanderbilt

Collaboration between Vanderbilt and startup Femtometrix leads to exclusive deal

Posted on Thursday, Jul. 18, 2013 — 3:31 PM
Want more research news from Vanderbilt? Subscribe to our weekly newsletter »

An innovative wafer inspection tool developed by a team of Vanderbilt professors and engineers has been licensed exclusively to startup company Femtometrix.

KEEP READING »